BeCe R & D test Sockets BeCe R & D test Sockets |


BeCe R & D test Sockets can be designed and customized to suit the most demanding interconnection needs. Performance comparable to direct soldered device.

Customizations include a variety of ESD Carriers and BeCe material.
High performance braided probes assures high test yields with lower test costs.


 
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BeCeTM Unique Feature

Contact Force : 15 to 30g / Pin
Contact Resistance : 25 – 50 mΩ
Compliance : 15 – 25% Of Free Length
Durability : >100k
Temperature Range : 45 – 180 °C
Pin Count : >5000 I/O
Fine Pitch : 0.4 mm & Above