BeCe R & D test Sockets can be designed and customized to suit the most demanding interconnection needs. Performance comparable to direct soldered device.
Customizations include a variety of ESD Carriers and BeCe material.
High performance braided probes assures high test yields with lower test costs.
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BeCeTM Unique Feature
| Contact Force |
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15 to 30g / Pin |
| Contact Resistance |
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25 – 50 mΩ |
| Compliance |
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15 – 25% Of Free Length |
| Durability |
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>100k |
| Temperature Range |
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45 – 180 °C |
| Pin Count |
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>5000 I/O |
| Fine Pitch |
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0.4 mm & Above |
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